BioVigilant does Pharmaceutical microbial contamination detection along with commercial air and water monitoring. Microbiological contamination monitoring; decontamination equipment ...
Inspection & Measurement; Defect, Particle, Bump, Contamination Detection, Review or Inspection ...
Minerva Biolabs serves all cell culture users and molecular biologists in academic and biopharmaceutical businesses. Learn more here ...
reliable, fast and affordable authentication and identification of human cancer lines, stem cell lines, as well as xenografts; human specimens using STR profiling, includes a mouse marker for detection of mouse DNA. Mycoplasma contamination detection, HLA testing and MSI testing are among other services also available ...
Inspection & Measurement; Probe Card Maintenance & Analysis Systems; Materials, Test; Equipment, Test; Probe Cards, Dut Boards, Probing Accessories & Incl Ceramic & Special Purpose Probe Cards; Materials, Substrate; Test, Monitor Wafers, Reclaim or Virgin; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Logic Test Systems; Test Sockets, Contactors & Contact Accessories, Electronic Plugs ...
Equipment, Assembly; Equipment, Inspection & Measurement; Deposition, Physical Vapor & Pvd, Sputtering, Evaporation Equipment; Dispensing Systems; hing, Stripping, Ashing Dry & Wet Equipment; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Equipment, Mems; Cleaning, Washing Equipment for Assembly & Packaging; Tape Automated Bonding & Tab, Bumped Tape Automated Bonding & Btab Equipment; Thermal, Assembly Equipment ...
Inspection & Measurement; Wafers; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; Inspection & Metrology; Led; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Plate Inspection Equipment; Fpd Inspection Equipment, Materials & Parts, Semiconductor Industry ...
Vertical Level Control, Electrical Chute Block Switches, Capacitive Level Switch, Air Operated Diaphragm Level Switch, Conductivity Level Switches, External Chamber for Side Mounted Switches, Float Guided Level Controller, Condensate Contamination Detection Systems, Rf Admittance Level Switch, Float Level Switches, Vibrating Rod Level Switch, Chamber Level Float Switch, Displacer Type Magnetic Level Switch, Float Guided Level Switch, Magnetic Float Level Switch, Conductivity Type Level Switch, Paddle, Switch Accessories ...
Plate Inspection Equipment; Inspection & Measurement; XRay, Xrf, 3D XRay, Lexes Systems; Instruments, Bench Top Test; Defect, Particle, Bump, Contamination Detection, Review or Inspection, Semiconductor Industry ...
Microscopes; Optical Microscopes; Die Inspection, Die Shear; Thermal Sensing, Measurement, Analysis; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement, Crystalline Orientation; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Line Width, Critical Dimension & Cd Measurement; Inspection & Measurement ...
Water Leak Detection, Data Center Cleaning, Computer Room Cleaning, Cleanroom Cleaning, Clean Room Cleaning, Laboratory Cleaning, Mission Critical Cleaning, Access Floor Cleaning, Contamination Control, Maintenance, Maintenance Service, Cleaning Protocol, Cleaning Protocols; Computer room cleaning services. Services such as floor, duct, telephone and post construction cleaning, environmental assessments, disaster recovery and workstation maintenance services are available ...
Equipment, Assembly; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Probe Cards, Dut Boards, Probing Accessories & Incl Ceramic & Special Purpose Probe Cards; Dispensing Systems; HVAC, Temperature, Humidity, Contamination Control; Equipment, Test; Failure Analysis Systems; Die Bonding, Attach Equipment; Printing Equipment, Screen Printing, Alignment, Film Printing; HVAC, Temperature, Humidity, Semiconductor Industry, Process Control, Printing Equipment ...
Equipment, Inspection & Measurement; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Die Inspection, Die Shear; Line Width, Critical Dimension (CD) Measurement; Microscopes: Confocal Scanning Microscope, 3-D Video Microscopes ...
Equipment, Inspection & Measurement; CV (capacitance-to-voltage) Probe systems; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Die Inspection, Die Shear; Film Thickness, Thickness, Uniformity Measurement, Ellipsometer; Microscopes: Optical Microscopes; Plate Inspection Equipment; Resistivity Measurement, 4 point probe, Sheet resistance; Stress, Refractive Index, Reflectivity & Conductivity Measurement; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement ...
Inspection & Measurement; Microscopes; Confocal Scanning Microscope, 3D Video Microscopes; Wire Bonding Inspection, Test; Die Inspection, Die Shear; Equipment, Test; Microscopes; Optical Microscopes; Overlay Measurement; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Film Thickness, Thickness, Uniformity Measurement, Ellipsometer; Optical Test Systems, Semiconductor Industry ...
Inspection & Measurement; Microscopes; Confocal Scanning Microscope, 3D Video Microscopes; Wire Bonding Inspection, Test; Die Inspection, Die Shear; Equipment, Test; Microscopes; Optical Microscopes; Overlay Measurement; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Film Thickness, Thickness, Uniformity Measurement, Ellipsometer; Optical Test Systems ...
