Yelo's Probed Burn In. Allows for Laser Arrays, Photodiode Arrays, Multi Chip Components, 40G & 100; Founded in 1983, Yelo's Burn In, Life Test and Qualification Systems Provide a Modular Tightly Temperature Controlled Environment in which to Test Photonics Components such as Multi Chip Edge Emitters, Transceivers (Both Pin and Apd), Transmitter Modules and more. Devices can be Tested Either Packaged or in the Chip On Carrier Form and can be Tested with In Situ Optical Measurements. No need to Remove, Optics Equipment, Photonics ...

Fiber Optic Module, 850Nm LED, 850Nm Vcsel, 1300Nm LED, 635Nm Laser Diode, 1310Nm Laser Diode, 1550Nm Laser Diode, Ingaas Pin Photodiode, Ingaas Pin Tia, Optoelectronic Components, Electronic Modules ...

Electronic Balance, Digital Electronic Scale, Laser Power Meter, Laser Power, Photodiode Detector, Digital Jewelry Scale, Pyroelectric Detector, Precision Weighing Balance, Electronic Jewelry Scale, Laser Energy Meter, Electronic Scale and Ba, Inspection Equipment ...

Laser Diode, Pin Photodiode, Pwdm Component, Cwdm Laser ...