our ebooth portal. E+H Metrology offers a complete l ine of Wafer Geometry, Resistivity and Stress measurement systems. Wafers up to 450mm can be measured on manual gauges or fully automated robotic or belt sorters using advanced software. Thickness, Flatness, Bow, Warp, Stress and wafer Resistivity can all be measured in a single high throughput wafer sorter using the advanced E+H MX NT operating software. E+H's, Semiconductor Industry, Sports Accessories ...

Our Schur Star bagging system allows our customers to package a wide variety of products using Schur’s pre made bags and SchurStar packaging machine. Quick change overs are our specialty With speeds up to 80 bags per minute, the SchurStar machine is easy to operate and maintain, and is compatible with all types of manual or automated filling, dosing and marking systems. SchurStar bags are available in a variety ...