our ebooth portal. E+H Metrology offers a complete l ine of Wafer Geometry, Resistivity and Stress measurement systems. Wafers up to 450mm can be measured on manual gauges or fully automated robotic or belt sorters using advanced software. Thickness, Flatness, Bow, Warp, Stress and wafer Resistivity can all be measured in a single high throughput wafer sorter using the advanced E+H MX NT operating software. E+H's, Semiconductor Industry, Sports Accessories ...
Industrial, Laboratory Equipment, Measuring Equipment, Test Instruments, GD-10 series is a new state-of-the art D. C. Resistivity/IP meter that has brought a revolutionary change in the resistivity and IP surveying method. It supports measurement functions which include 1D VES/SP/IP sounding, 2D/3D resistivity imaging/IP imaging and high power IP survey, as well as under water and cross-hole surveys. the main measurement parameters include ...
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