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MicroSense Precision Wafer Measurement Systems; MicroSense UltraMap – the New Standard for 200mm Polished Wafer Flatness Measurement; the new MicroSense UMA C200L wafer metrology system measures the flatness, thickness and shape of bare 200mm silicon wafers with industry leading throughtput, 32% higher than legacy systems. the UltraMap system provides; Industry standard dual capacitance sensor measurement ...