Yelo's Probed Burn In. Allows for Laser Arrays, Photodiode Arrays, Multi Chip Components, 40G & 100; Founded in 1983, Yelo's Burn In, Life Test and Qualification Systems Provide a Modular Tightly Temperature Controlled Environment in which to Test Photonics Components such as Multi Chip Edge Emitters, Transceivers (Both Pin and Apd), Transmitter Modules and more. Devices can be Tested Either Packaged or in the Chip On Carrier Form and can be Tested with In Situ Optical Measurements. No need to Remove, Optics Equipment, Photonics ...
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